S-4500 Hitachi Ultra High Resolution Scanning Electron Microscope (SEM)


S-4500 Hitachi SEM

The S-4500 Hitachi Ultra High Resolution SEM is a field emission scanning electron microscopy, which provides high quality three dimensional images of the surface of a sample with a resolution of 1 nm. This is done by bombarding the sample with a beam of electrons, which interact with the atoms of the sample to emit signals about the surface of the sample, i.e., the generation of secondary electron from the sample surface. Furthermore, the S-4500 Hitachi Ultra High Resolution SEM is equipped with an energy dispersive X-Ray fluorescence detection system for Elemental Analysis. Below are some images obtained with this field emission SEM1.



1Biological Imaging Center
 

Manufacturing Engineering

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