The SJ-401 Surface Profilometer, shown above, provides Skidless/Skidded measurement with a measuring range in the z-direction of up to 2,400µm with an option stylus and 25mm in the x-direction at speeds of 0.05mm/s, 0.1mm/s, 0.5mm/s, or 1.0mm/s. In the laboratory, these depth profiles are done with the SJ-401 mounted on a manual column stand. The SJ-401 Surface Profilometer assesses for Primary profile (P), Roughness profile (R), and Filtered waviness profile (W), and evaluates for the following parameters: Ra, Ry, Rz, Rq, Pc, R3z, mr, Rt, Rp, Rv, Sm, S, δc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Lo, Ppi, R, AR, Rx, Δa, Δq, Ku, HSC, mrd, Sk, W, AW, Wte, Wx, and Vo1. A depth profile obtained with the Surface Roughness Tester SJ-401 is shown in the figure below.
Other features of the SJ-401 Surface Profilometer include: