Facilities
CAPE RESOURCES/ FACILITIES:
Printing and Material Deposition
- K-Proofer (Gravure&Flexo)
- FujiFilm Dimatix material printer
- Flexo hand proofers
- Screen Printer MSP-485 w/ Ulign IV vision
- Spin coater (2,000-10,000 rpm), two steps
- PC Labview operated NIMA dip-coater
- Hitachi-4 (Thermal Evaporator) Metal, Al, Au etc.
- Cylindrical Laboratory Coater
- Mosier Proofing Press
- Prufbau Proofing Press
- Cerutti Rotogravure Press (4 units)
- Comco Narrow Web Flexo Press (3 units)
- High Speed Coater (4000 fpm, 40 in)
- Kasper/Quintel 2001C Contact/Proximity Mask Aligner
- Hot filament CVD (atmospheric quartz tube reactor for carbon films)
- Microwave Plasma (2.56 GHz) CVD (PECVD-60-M, TEK-VAC Industries, Inc.)
- RF (13.56 MHz) Plasma CVD (PECVD-60-R, TEK-VAC Industries, Inc.)
Printability evaluation and substrate characterization
- ImageXpert, Verity IA and Image Pro Plus Image Analysis
- Datacolor, X-Rite and GretagMacbeth Spectrophotometers
- Tobias Mottle Tester
- Atlas Weatherometer
- BYK Gardner Multi-angle gloss meter
- Emveco 210A stylus profilometer
- Verity smoothness tester
- Parker Print Smoothness and Air Permeability tester
- Emco Ultrasonic Penetrometer
Electrical Measurement
- Keithly 6517A Electrometer-High Resistance Meter (peta-ohm capability)
- Keithly 8009 High-Resistance High-Voltage Test Chamber
- Agilent 4338B Milliohm, 1kHz Complex Impedance Measurement
- Extech 380560 DC Milliohm Meter
- Keithly 2602 Dual-Channel System Source-Meter , 4-point I-V measurement
- PC Labview operated Keithley 2400 electrometer
- Agilent 3458A, High precision 8.5 digit multimeter
- Agilent E4980A High Precision LCR Meter, 20 Hz to 2 MHz
RF/RFID Measurement
- Two 10’ x 10’ RF screen rooms
- Agilent 4396B network/spectrum/impedance analyzer 1.8 GHz
- Agilent 4395B network/spectrum analyzer 500 MHz
- Diamond Engineering DAMS5000 Antenna Measurement System
- Tektronix RSA3303A DC-3 GHz Real Time Spectrum Analyzer
- Tektronix NetTek Analyzer Portable Platform with NetTek Transmitter Tester
- RF Signal Generator up to 2.2 GHz
- RF Signal Generator up to 990 MHz
- Tektronix DPO4104 Oscilloscope, 4 channel, 1 GHz
- One Alien Technology RFID Demonstration Kit
- One Matrics/Symbol RFID Demonstration Kit
- Multiple RFID/ISM Band Antennas antenna
- Numerous RFID tags (Alien I, D, and squiggle tags and Matrics tags)
- Versatruss 10” box-truss portable structure for antenna/reader mounting
Material Characterization
- TA Instruments Rheometrics Stress Rheometer AR2000
- Particle Size Analyzer (Nicom 370 and Accusizer 770)
- Perkin-Elmer Differential Scanning Calorimetry Pyris 1 DSC
- Rheometric Scientific Dynamic Mechanical Thermal Analysis DMTA V
- TA Instruments Thermal Gravimetric Analysis Q500
- Raman spectrometer (Solution # 633) He/Ne 633 nm
- OceanOptics HR2000 fiber-optics UV-Vis spectrometer
Surface Characterization
- First Ten Angstroms Dynamic Contact Angle Analyzer FTA200
- Dynamic surface tension analyzer SensaDyne
- Krüss Tensiometer K10T (plate/ring)
- Micromeritics Mercury Intrusion Porosimeter AutoPore IV
- Micromeritics Surface area and porosity analyze TriStar
- White Light Interferometry WYKO RST-Plus
- Atomic Force Microscopy Autoprobe CP (Thermomicroscopes now Veeco) with possibility of contact and non-contact mode scanning, friction force microscopy, ultrasonic force microscopy, magnetic force microscopy, force distance analysis and local electrical conductivity testing
- Optical microscope Olympus model PME (1500x) with CCD camera
Other
- Terra Universal Inc. Series 100 Acrylic Glove Box
- Environmental Test Chamber Caron 6030 (humidification and refrigeration capabilities)
- Cole Parmer Clean Room Oven (40-250 °C)
- Fusion UV system I 300 MB
- Fourdrinier Paper Machine
